Specifications

• Agilent, CSI 5500 AFM.
• Large multi-purpose scanner:
  • Scanning range: 90 µm × 90 µm
  • Z range: 6.5 µm.
• Small scanner:
  • Scanning range: 9 µm × 9 µm
  • Z range: 2 µm.

Principles

Atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100Å in diameter. The tip is located at the free end of a cantilever that is 100 to 200μm long. Forces between the tip and the sample surface cause the cantilever to bend or deflect. A detector measures the cantilever deflection as the tip is scanned over the sample. The measured cantilever deflections allow a computer to generate a map of surface topography.

Capabilities

• Multi-scan mode research level AFM with advanced image processing capabilities.
• Environmental control enables control of humidity, monitoring of oxygen levels and easy introduction and purging of gases in the sample chamber.
• Temperature control is available with heating of sample up to 250°C and allows imaging during temperature changes.
• Capability to scan in liquids with an electro-chemical cell.
• AFM controllers and software allow simultaneous real-time display of up to eight channels.

Applications

• Material Science.
• Electro Chemistry.
• Polymer science.
• Life Science & Biotechnology.