About Equipment Forms Publications Researcher Rules & Regulations Nanotechnology Research Facility List of Equipment Image High-Resolution X-Ray Diffractometer (XRD) Specifications Model: Rigaku SmartLab PhotonMax high-flux 9 kW rotating anode X-ray source. Read more Image High-Temperature Tube Furnace Specifications Nabertherm (RS 80/750/13). Operating Temp: up to 1300 °C. Casing made of. Read more Image Physical Vapor Deposition System Specifications Model: 5909, CHA Solutions. Vacuum Chamber: Type: Water cooled stainless. Read more Image Microplotter Specifications Model: Sonoplot Microplotter -- II. Feature Size: 5 µm - 200 µm. Feature. Read more Image Static & Dynamic Light Scattering (Zetasizer Nano-ZS) Specifications Model: Zetasizer Nano ZS, Malvern. Size range: 0.6nm to 6μm hydrodynamic. Read more Image Fourier Transform Infrared Spectroscopy (FTIR) Specifications Model: Agilent Cary 630. Interferometer: 25 mm, permanently aligned. Read more Image Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) Specifications Model: Varian 710-ES. Sample introduction: Glass, single-pass cyclone spray. Read more Image UV-Vis Spectrophotometer Specifications Model: Varian Cary 50. Monochromator: Czerny-Turner. Beam splitting system. Read more Image Ion Chromatography (IC) Specifications Model: Shimadzu Prominence HPLC. Solvent delivery pump LC-20ADSP. Read more Image Dual High-Energy Ball Milling Specifications Model: SPEX, 8000D Mixer/Mill. Motor 1/3 hp, 1725 RPM @ 60Hz, 1425 RPM @. Read more Image Electro polishing & Etching System Specifications Struers LectroPol-5 Automatic, microprocessor controlled electrolytic. Read more Image Sequential Wavelength Dispersive X-ray Fluorescence (WDXRF) Specifications 4kW (60 kV, 150 mA) X-ray tube with 30 micron Be end-window. Scanning speed. Read more Image Automatic Grinder & Polisher Specifications Model: Struers Laboforce 50. Force, Individual specimens 5 - 30 N. Sample. Read more Image Atomic Force Microscope (AFM) Specifications Agilent, CSI 5500 AFM. Large multi-purpose scanner: Scanning range: 90 µm ×. Read more Image Digital Optical Microscope Specifications Carl Zeiss (Axio imager A1M). Improved optics with superb contrast and. Read more Image Stereomicroscope Specifications Carl Zeiss Stemi-2000-C. 7.7X to 1X Zoom Range. Video Adaptable. Long. Read more Image Nanomechanical Test Instrument Specifications Hysitron (Model Ti -- 700Ubi). Testing mode: Quasi-static indentation. Read more Image Multi-Function Tribometer Specifications Rtec Instruments Inc. USA - Multi-Function Tribometer Model no. MFT-5000. 1. Read more Image Rheometer Specifications - Model: ARES G2, TA Instruments. - Transducer: Force Rebalance Transducer. Read more Image Universal Testing Machine Specifications Instron (Model 5581). Type: Electro-mechanical. System capacity: 50 kN. Read more Image Microhardness Tester Specifications Model: Falcon 503 InnovaTest. Multi Load Cell, Closed Loop force. Read more Image Cross Section Polisher Specifications JEOL (SM-09010). Cross-section polishing using ion beam milling. Pressure. Read more Image Ellipsometer (Auto-Nulling Spectroscopic Imaging) Specifications Nanofilm_EP3SE. Moving range of x/y/z. stage:100mm(x/y)30mm(z). Read more
Image High-Resolution X-Ray Diffractometer (XRD) Specifications Model: Rigaku SmartLab PhotonMax high-flux 9 kW rotating anode X-ray source. Read more
Image High-Temperature Tube Furnace Specifications Nabertherm (RS 80/750/13). Operating Temp: up to 1300 °C. Casing made of. Read more
Image Physical Vapor Deposition System Specifications Model: 5909, CHA Solutions. Vacuum Chamber: Type: Water cooled stainless. Read more
Image Microplotter Specifications Model: Sonoplot Microplotter -- II. Feature Size: 5 µm - 200 µm. Feature. Read more
Image Static & Dynamic Light Scattering (Zetasizer Nano-ZS) Specifications Model: Zetasizer Nano ZS, Malvern. Size range: 0.6nm to 6μm hydrodynamic. Read more
Image Fourier Transform Infrared Spectroscopy (FTIR) Specifications Model: Agilent Cary 630. Interferometer: 25 mm, permanently aligned. Read more
Image Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) Specifications Model: Varian 710-ES. Sample introduction: Glass, single-pass cyclone spray. Read more
Image UV-Vis Spectrophotometer Specifications Model: Varian Cary 50. Monochromator: Czerny-Turner. Beam splitting system. Read more
Image Ion Chromatography (IC) Specifications Model: Shimadzu Prominence HPLC. Solvent delivery pump LC-20ADSP. Read more
Image Dual High-Energy Ball Milling Specifications Model: SPEX, 8000D Mixer/Mill. Motor 1/3 hp, 1725 RPM @ 60Hz, 1425 RPM @. Read more
Image Electro polishing & Etching System Specifications Struers LectroPol-5 Automatic, microprocessor controlled electrolytic. Read more
Image Sequential Wavelength Dispersive X-ray Fluorescence (WDXRF) Specifications 4kW (60 kV, 150 mA) X-ray tube with 30 micron Be end-window. Scanning speed. Read more
Image Automatic Grinder & Polisher Specifications Model: Struers Laboforce 50. Force, Individual specimens 5 - 30 N. Sample. Read more
Image Atomic Force Microscope (AFM) Specifications Agilent, CSI 5500 AFM. Large multi-purpose scanner: Scanning range: 90 µm ×. Read more
Image Digital Optical Microscope Specifications Carl Zeiss (Axio imager A1M). Improved optics with superb contrast and. Read more
Image Stereomicroscope Specifications Carl Zeiss Stemi-2000-C. 7.7X to 1X Zoom Range. Video Adaptable. Long. Read more
Image Nanomechanical Test Instrument Specifications Hysitron (Model Ti -- 700Ubi). Testing mode: Quasi-static indentation. Read more
Image Multi-Function Tribometer Specifications Rtec Instruments Inc. USA - Multi-Function Tribometer Model no. MFT-5000. 1. Read more
Image Rheometer Specifications - Model: ARES G2, TA Instruments. - Transducer: Force Rebalance Transducer. Read more
Image Universal Testing Machine Specifications Instron (Model 5581). Type: Electro-mechanical. System capacity: 50 kN. Read more
Image Microhardness Tester Specifications Model: Falcon 503 InnovaTest. Multi Load Cell, Closed Loop force. Read more
Image Cross Section Polisher Specifications JEOL (SM-09010). Cross-section polishing using ion beam milling. Pressure. Read more
Image Ellipsometer (Auto-Nulling Spectroscopic Imaging) Specifications Nanofilm_EP3SE. Moving range of x/y/z. stage:100mm(x/y)30mm(z). Read more
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